• Small borosilicate glass microspheres have fewer spherical imperfections and inclusions than other glass microspheres. They also have better mechanical and thermal stability. This series has been calibrated with NIST traceable methods of optical microscopy. They are packaged as dry powders in 1 gram bottles. They have a density of 2.50-2.55g/cm 3 and an index of refraction of 1.56 @ 589nm (23°C). Brands: Thermo Scientific
  • Small borosilicate glass microspheres have fewer spherical imperfections and inclusions than other glass microspheres. They also have better mechanical and thermal stability. This series has been calibrated with NIST traceable methods of optical microscopy. They are packaged as dry powders in 1 gram bottles. They have a density of 2.50-2.55g/cm 3 and an index of refraction of 1.56 @ 589nm (23°C). Brands: Thermo Scientific
  • Small borosilicate glass microspheres have fewer spherical imperfections and inclusions than other glass microspheres. They also have better mechanical and thermal stability. This series has been calibrated with NIST traceable methods of optical microscopy. They are packaged as dry powders in 1 gram bottles. They have a density of 2.50-2.55g/cm 3 and an index of refraction of 1.56 @ 589nm (23°C). Brands: Thermo Scientific
  • Small borosilicate glass microspheres have fewer spherical imperfections and inclusions than other glass microspheres. They also have better mechanical and thermal stability. This series has been calibrated with NIST traceable methods of optical microscopy. They are packaged as dry powders in 1 gram bottles. They have a density of 2.50-2.55g/cm 3 and an index of refraction of 1.56 @ 589nm (23°C). Brands: Thermo Scientific
  • Small borosilicate glass microspheres have fewer spherical imperfections and inclusions than other glass microspheres. They also have better mechanical and thermal stability. This series has been calibrated with NIST traceable methods of optical microscopy. They are packaged as dry powders in 1 gram bottles. They have a density of 2.50-2.55g/cm 3 and an index of refraction of 1.56 @ 589nm (23°C). Brands: Thermo Scientific
  • Small borosilicate glass microspheres have fewer spherical imperfections and inclusions than other glass microspheres. They also have better mechanical and thermal stability. This series has been calibrated with NIST traceable methods of optical microscopy. They are packaged as dry powders in 1 gram bottles. They have a density of 2.50-2.55g/cm 3 and an index of refraction of 1.56 @ 589nm (23°C). Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • This series is used as NIST traceable calibrants or controls for instruments requiring a higher density and more contrast to incident radiation than that provided by the polymer microspheres. The microspheres are made of soda lime glass which has trace amounts of metallic elements. This makes them easily detectable by non-dispersive X-ray methods and improves their contrast and reflectivity in optical, ultrasonic and electron beam detection methods. Most of the non-spherical and broken particles have been removed, assuring a high percentage of round spheres. They are packaged as dry powders in 1 gram bottles. The soda lime microspheres have a density of 2.4-2.5g/cm3 and an index of refraction of 1.51 @ 589nm. The softening temperature is 720°C and the dielectric constant is 7.3 @ 1 KHz and 20°C. Brands: Thermo Scientific
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
  • Surf-Cal

    1.00
    Particle Deposition Standards provide a cost effective and reliable method of calibration of bare semiconductor silicon wafer Surface Scanning Inspection systems (SSIS) over a range of particle sizes from 0.047 to 3.0 µm. The product is a suspension of NIST traceable polystyrene microspheres whose concentration has been optimized for deposition on wafers by nebulization. When used with conventional particle deposition systems, the 3 x 108 particles per mL suspension will deposit between 6 and 10 particles per cm2 on a 200 mm wafer in 30-60 seconds. The 1 x 1010 particles per mL suspension is ideal for deposition systems using particle exclusion techniques where the deposition times and concentrations vary. The cleanliness of the suspension minimizes residue on the particle and the surface of the wafer, allowing easy calibration of scanners over their entire range of operation. With low non-volatile solids content, SURF-CAL is useful for other aerosol particle measurement applications. The clean suspension also benefits particle detection on patterned wafers, mask and reticule, and disk drives.
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